Shallow-trench-isolation bounded single-photon avalanche diodes in commercial deep submicron CMOS technologies
by Finkelstein, Hod, Ph.D., UNIVERSITY OF CALIFORNIA, SAN DIEGO, 2007, 299 pages; 3274523

Abstract:

This dissertation describes the first single-photon detection device to be manufactured in a commercial deep-submicron CMOS technology. It also describes novel self-timed peripheral circuits which optimize the performance of the new device. An extension of the new device for dual-color single-photon detection is investigated. Finally, an area- and power-efficient method for single-photon frequency upconversion is presented, analyzed, and experimentally examined.

Single-photon avalanche diodes have been used in diverse applications, including three-dimensional laser radar, three-dimensional facial mapping, fluorescence-correlation techniques and time-domain tomography. Due to the high electric fields which these devices must sustain, they have traditionally been manufactured in custom processes, severely limiting their speed and the ability to integrate them in high-resolution imagers. By utilizing a process module originally designed to enhance the performance of CMOS transistors, we achieve highly planar junctions in an area-efficient manner. This results in SPADs exhibiting high fill factors, small pitch and ultrafast operation. Device miniaturization is accompanied by excessive noise, which was shown to emanate from trapped avalanche charges. Due to the fast recharging of the device, these charges are released in a subsequent charged phase of the device, causing correlated after-pulses. We present electrostatic and electrical simulation results, as well as a comprehensive characterization of the new device. We also show for the first time that by utilizing the two junctions included in the device, we can selectively detect photons of different wavelengths in the same pixel, as is desirable in cross-correlation experiments.

This dissertation also describes an efficient new method for single-photon frequency upconversion. This is desirable for applications including quantum-key distribution and high-resolution near-infrared imaging. The new technique is based on electroluminescence in or near the multiplication region of the device, resulting from hot-carrier recombination. We model a proposed hybrid device and deduce the critical parameters for efficient upconversion. Lastly, we experimentally demonstrate that the electroluminescence yield from an InGaAs/InAlAs avalanche diode is sufficient for highly-efficient upconversion.

 
AdviserSadik Esener
SchoolUNIVERSITY OF CALIFORNIA, SAN DIEGO
SourceDAI/B 68-06, p. , Oct 2007
Source TypeDissertation
SubjectsElectrical engineering; Optics
Publication Number3274523
Adobe PDF Access the complete dissertation:
 

» Find an electronic copy at your library.
  Use the link below to access a full citation record of this graduate work:
  http://gateway.proquest.com/openurl%3furl_ver=Z39.88-2004%26res_dat=xri:pqdiss%26rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation%26rft_dat=xri:pqdiss:3274523
  If your library subscribes to the ProQuest Dissertations & Theses (PQDT) database, you may be entitled to a free electronic version of this graduate work. If not, you will have the option to purchase one, and access a 24 page preview for free (if available).

About ProQuest Dissertations & Theses
With over 2.3 million records, the ProQuest Dissertations & Theses (PQDT) database is the most comprehensive collection of dissertations and theses in the world. It is the database of record for graduate research.

The database includes citations of graduate works ranging from the first U.S. dissertation, accepted in 1861, to those accepted as recently as last semester. Of the 2.3 million graduate works included in the database, ProQuest offers more than 1.9 million in full text formats. Of those, over 860,000 are available in PDF format. More than 60,000 dissertations and theses are added to the database each year.

If you have questions, please feel free to visit the ProQuest Web site - http://www.proquest.com - or call ProQuest Hotline Customer Support at 1-800-521-3042.